Full Description

Organic flat sheet and hollow fiber ultrafiltration membranes were characterized by opticaland microscopic methods. White Light Interferometry (WLI) and Atomic Force Microscopy(AFM) show that the membrane roughness increases markedly with the observation scale andthat there is continuity between the different scan sizes and techniques for the determinationof the RMS roughnesses. The high angular resolution ellipsometric measurements allows forobtaining the signature of each cut-off and the origin of the scattering was identified as comingfrom membrane bulk. Includes 19 references, table, figures.

Product Details

Edition: Vol. - No. Published: 11/01/2009 Number of Pages: 6File Size: 1 file , 1.8 MB