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IEC 61649 Ed. 1.0 b:1997

M00003013

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IEC 61649 Ed. 1.0 b:1997 [ Withdrawn ] Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

standard by International Electrotechnical Commission, 05/16/1997

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Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.

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Edition: 1.0 Published: 05/16/1997 Number of Pages: 31 File Size: 1 file , 150 KB