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IEC 60748-11-1 Ed. 1.0 b:1992

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IEC 60748-11-1 Ed. 1.0 b:1992 Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

standard by International Electrotechnical Commission, 04/01/1992

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The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.

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Edition: 1.0 Published: 04/01/1992 Number of Pages: 71 File Size: 1 file , 2.5 MB