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IEC 62276 Ed. 1.0 en:2005

M00013574

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IEC 62276 Ed. 1.0 en:2005 [ Withdrawn ] Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

standard by International Electrotechnical Commission, 05/30/2005

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Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.

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Edition: 1.0 Published: 05/30/2005 Number of Pages: 34 File Size: 1 file , 740 KB