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IEC 60749-1 Ed. 1.0 b:2002

M00013807

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IEC 60749-1 Ed. 1.0 b:2002 Semiconductor devices - Mechanical and climatic test methods - Part 1: General

standard by International Electrotechnical Commission, 08/30/2002

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Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

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Edition: 1.0 Published: 08/30/2002 Number of Pages: 15 File Size: 1 file , 390 KB